6 Patents
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- US123438402025Control of Processing Parameters for Substrate Polishing with Substrate Precession
Applied Materials, Inc.
0 cites - US119318532024Control of Processing Parameters for Substrate Polishing with Angularly Distributed Zones Using Cost Function
Applied Materials, Inc.
0 cites - US119114042024Fucosylation and Immune Surveillance in Melanoma
H. Lee Moffitt Cancer Center And Research Institute, Inc.
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