5 Patents
- US124428552025Built-in Circuit for Testing Process and Layout Effects of an Integrated Circuit Die
MARVELL ASIA PTE Ltd
0 cites - 0 cites
- US119627092024Structures and Methods for Deriving Stable Physical Unclonable Functions from Semiconductor Devices
Marvell Asia Pte, Ltd.
0 cites - 0 cites
- US116930482023Cascaded Sensing Circuits for Detecting and Monitoring Cracks in an Integrated Circuit
Globalfoundries U.S. Inc.
0 cites