Eric Chin Hong Ng

3 Patents

• US122117172025

  Spatial Pattern Loading Measurement with Imaging Metrology

  Applied Materials, Inc.

  0 cites
• US120989142024

  Surface Roughness and Emissivity Determination

  Applied Materials, Inc.

  0 cites
• US120625832024

  Optical Metrology Models for In-line Film Thickness Measurements

  Applied Materials Israel Ltd.

  0 cites