Patents/Inventors

Einat Peled

HaifaIL1 patent

2 Patents

US118618242024
Reference Image Grouping in Overlay Metrology
KLA Corporation
0 cites
US116159742023
Fab Management with Dynamic Sampling Plans, Optimized Wafer Measurement Paths and Optimized Wafer Transport, Using Quantum Computing
KLA CORPORATION
0 cites