2 Patents
- US122535382025Method of Examining a Sample in a Scanning Tunneling Microscope Using Tip-to-sample Distance Variations
CESKE VYSOKE UCENI TECHNICKE V PRAZE
0 cites - US122535392025Method of Examining a Sample in an Atomic Force Microscope Using Attractive Tip-to-sample Interaction
CESKE VYSOKE UCENI TECHNICKE V PRAZE
0 cites