Patents/Inventors

Edo Maria Hulsebos

WaalreNL5 patents

6 Patents

US124932852025
Determining a Correction to a Process
ASML NETHERLANDS B.V.
0 cites
US122875832025
Method for Modeling Measurement Data Over a Substrate Area and Associated Apparatuses
ASML Netherlands B.V.
0 cites
US120323052024
Alignment Method and Associated Alignment and Lithographic Apparatuses
ASML NETHERLANDS B.V.
0 cites
US119948452024
Determining a Correction to a Process
ASML NETHERLANDS B.V.
0 cites
US119661662024
Measurement Apparatus and a Method for Determining a Substrate Grid
ASML NETHERLANDS B.V.
0 cites
US119278922024
Alignment Method and Associated Alignment and Lithographic Apparatuses
ASML Netherlands B.V.
0 cites