Patents/Inventors

Dror Shemesh

Hod HasharonIL2 patents

3 Patents

US124808982025
Z-profiling of Wafers Based on X-ray Measurements
Applied Materials Israel Ltd.
0 cites
US119612212024
Defect Examination on a Semiconductor Specimen
Applied Materials Israel Ltd.
0 cites
US115433682023
X-ray Based Evaluation of a Status of a Structure of a Substrate
APPLIED MATERIALS ISRAEL Ltd.
0 cites