Patents/Inventors

Doyoung Yoon

SeoulKR2 patents

3 Patents

US121756552024
Substrate Inspection Method and Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US121302422024
Inspection System of Semiconductor Wafer and Method of Driving the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US117545102023
Inspection System of Semiconductor Wafer and Method of Driving the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites