Douglas C. Cappelli

3 Patents

• US124297802025

  Multiple Objectives Metrology System, Lithographic Apparatus, and Methods Thereof

  ASML Holding N.V.

  0 cites
• US122926972025

  Self-referencing Interferometer and Dual Self-referencing Interferometer Devices

  ASML HOLDING N.V.

  0 cites
• US122875852025

  Polarization Selection Metrology System, Lithographic Apparatus, and Methods Thereof

  ASML Holding N.V.

  0 cites