Patents/Inventors

Donyun Kim

SeoulKR3 patents

3 Patents

US123076512025
Method of Detecting Measurement Error of SEM Equipment and Method of Aligning SEM Equipment
SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION
0 cites
US122052672025
Pattern Inspection Method Using Pattern Model
Seoul National University R&DB Foundation
0 cites
US117400732023
Method for Measuring CD Using Scanning Electron Microscope
SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION
0 cites