Dong Woon Park

7 Patents

• US124761192025

  Substrate Processing Apparatus and Substrate Processing Method

  SEMES CO., Ltd.

  0 cites
• US124287302025

  Apparatus for Treating Substrate

  SEMES CO., Ltd.

  0 cites
• US123313992025

  Apparatus for Smoothly Exhausting the Atmosphere in a Processing Space When Rotating a Substrate with Liquid

  SEMES CO., Ltd.

  0 cites
• US121988932025

  Plasma Process Monitoring Apparatus Using Terahertz Waves and Monitoring Method Thereof

  IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY)

  0 cites
• US120553782024

  Thickness Measuring Device

  ACTRO CO., Ltd.

  0 cites
• US118290702023

  Apparatus for Treating a Substrate

  SEMES CO., Ltd.

  0 cites
• US117819812023

  Specimen Inspection Apparatus and Specimen Inspection Method

  ACTRO CO., Ltd.

  0 cites