Dong Whan Shin

5 Patents

• US126028292026

  Method and Device for Determining Abnormality in Image Acquisition Equipment

  SK On Co., Ltd.

  0 cites
• US123793332025

  Battery Holder Device and Battery Test System Including the Same

  SK ON CO., Ltd.

  0 cites
• US121550452024

  Battery Cell Inspection Device and Battery Cell Inspection System Including the Same

  SK ON CO., Ltd.

  0 cites
• US121419532024

  Tape Inspection Device and Secondary Battery Manufacturing System Having the Same

  SK ON CO., Ltd.

  0 cites
• US120611572024

  Battery Holder Device and Battery Test System Including the Same

  SK ON CO., Ltd.

  0 cites