Dong Sheng Rao

7 Patents

• US125105882025

  Variable Temperature Test System for Providing Different Test Environments and Operation Method Thereof

  Hefei Core Storage Electronic Limited

  0 cites
• US125048842025

  Service Lifetime Monitoring and Early Warning Method, Memory Storage Device and Memory Control Circuit Unit

  Hefei Core Storage Electronic Limited

  0 cites
• US124616712025

  Memory Management Method for Improving the Utilization Rate, Memory Storage Device, and Memory Control Circuit Unit

  Hefei Core Storage Electronic Limited

  0 cites
• US122427302025

  Data Arrangement Method Based on File System, Memory Storage Device and Memory Control Circuit Unit

  Hefei Core Storage Electronic Limited

  0 cites
• US118032082023

  Timer Calibration Method and Electronic Device

  Hefei Core Storage Electronic Limited

  0 cites
• US117155322023

  Risk Assessment Method Based on Data Priority, Memory Storage Device, and Memory Control Circuit Unit

  Hefei Core Storage Electronic Limited

  0 cites
• US116935672023

  Memory Performance Optimization Method, Memory Control Circuit Unit and Memory Storage Device

  Hefei Core Storage Electronic Limited

  0 cites