3 Patents
- US117742412023Line Edge Roughness Analysis Using Atomic Force Microscopy
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - US117199012023Dense Wavelength Division Multiplexing Fiber Optic Apparatuses and Related Equipment
Corning Research & Development Corporation
0 cites - US117035232023Method and Apparatus for Detecting Ferroelectric Signal
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites