2 Patents
- US124513222025Method of Forming a Multipole Device, Method of Influencing an Electron Beam, and Multipole Device
ICT Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Mbh
0 cites - US115453382023Charged Particle Beam Apparatus and Method of Controlling Sample Charge
ICT Integrated Circuit Testing Gesellschaft Für Halbleiterriftechnik Mbh
0 cites