Dominic J. Benvegnu

21 Patents

• US124916032025

  Passive Acoustic Monitoring and Acoustic Sensors for Chemical Mechanical Polishing

  Applied Materials, Inc.

  0 cites
• US123226592025

  Pixel Classification of Film Non-uniformity Based on Processing of Substrate Images

  Applied Materials, Inc.

  0 cites
• US122887242025

  Region Classification of Film Non-uniformity Based on Processing of Substrate Images

  Applied Materials, Inc.

  0 cites
• US122720472025

  Residue Measurement from Machine Learning Based Processing of Substrate Images

  Applied Materials, Inc.

  0 cites
• US122576652025

  Machine Vision as Input to a CMP Process Control Algorithm

  Applied Materials, Inc.

  0 cites
• US122335052025

  Polishing System with Capacitive Shear Sensor

  Applied Materials, Inc.

  0 cites
• US121699252024

  System Using Film Thickness Estimation from Machine Learning Based Processing of Substrate Images

  Applied Materials, Inc.

  0 cites
• US121481482024

  Thickness Measurement of Substrate Using Color Metrology

  Applied Materials, Inc.

  0 cites
• US119318602024

  Consumable Part Monitoring in Chemical Mechanical Polisher

  Applied Materials, Inc.

  0 cites
• US118477762023

  System Using Film Thickness Estimation from Machine Learning Based Processing of Substrate Images

  Applied Materials, Inc.

  0 cites
• US118369132023

  Film Thickness Estimation from Machine Learning Based Processing of Substrate Images

  Applied Materials, Inc.

  0 cites
• US117761092023

  Thickness Measurement of Substrate Using Color Metrology

  Applied Materials, Inc.

  0 cites
• US117151932023

  Color Imaging for CMP Monitoring

  Applied Materials, Inc.

  0 cites
• US117156722023

  Endpoint Detection for Chemical Mechanical Polishing Based on Spectrometry

  Applied Materials, Inc.

  0 cites
• US117017492023

  Monitoring of Vibrations During Chemical Mechanical Polishing

  Applied Materials, Inc.

  0 cites
• US116995952023

  Imaging for Monitoring Thickness in a Substrate Cleaning System

  Applied Materials, Inc.

  0 cites
• US116821142023

  Thickness Measurement of Substrate Using Color Metrology

  Applied Materials, Inc.

  0 cites
• US116607222023

  Polishing System with Capacitive Shear Sensor

  Applied Materials, Inc.

  0 cites
• US115773562023

  Machine Vision as Input to a CMP Process Control Algorithm

  Applied Materials, Inc.

  0 cites
• US115717862023

  Consumable Part Monitoring in Chemical Mechanical Polisher

  Applied Materials, Inc.

  0 cites
• US115570482023

  Thickness Measurement of Substrate Using Color Metrology

  Applied Materials, Inc.

  0 cites