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Inventors
Dmitry Simakov
Jena
DE
2 patents
2 Patents
US12372431
2025
Method for Determining an Imaging Quality of an Optical System When Illuminated by Illumination Light Within a Pupil to Be Measured
Carl Zeiss SMT GmbH
0 cites
US11899358
2024
Method for Measuring Photomasks
Carl Zeiss SMT GmbH
0 cites