8 Patents
- US125575882026Methods of Cross-section Imaging of an Inspection Volume in a Wafer
Carl Zeiss SMT GmbH
0 cites - US122887052025FIB-SEM 3D Tomography for Measuring Shape Deviations of HAR Structures
Carl Zeiss SMT GmbH
0 cites - US122887062025Parameterizing X-ray Scattering Measurement Using Slice-and-image Tomographic Imaging of Semiconductor Structures
Carl Zeiss SMT GmbH
0 cites - US122835042025Contact Area Size Determination Between 3D Structures in an Integrated Semiconductor Sample
Carl Zeiss SMT GmbH
0 cites - US121481392024Methods and Evaluation Devices for Analyzing Three-dimensional Data Sets Representing Devices
Carl Zeiss SMT GmbH
0 cites - 0 cites
- US119159082024Method for Measuring a Sample and Microscope Implementing the Method
Carl Zeiss SMT GmbH
0 cites - US118481722023Method for Measuring a Sample and Microscope Implementing the Method
Carl Zeiss SMT GmbH
0 cites