20 Patents
- US126092822026Multi-beam Charged Particle System and Method of Controlling the Working Distance in a Multi-beam Charged Particle System
Carl Zeiss Multisem GmbH
0 cites - US125867492026Certain Improvements of Multi-beam Generating and Multi-beam Deflecting Units
Carl Zeiss Multisem GmbH
0 cites - US124943432025Multiple Particle Beam Microscope and Associated Method with Fast Autofocus Around an Adjustable Working Distance
Carl Zeiss Multisem GmbH
0 cites - 0 cites
- US123409732025Particle Beam System Including a Multi-beam Deflection Device and a Beam Stop, Method for Operating the Particle Beam System and Associated Computer Program Product
Carl Zeiss Multisem GmbH
0 cites - US123004622025System Comprising a Multi-beam Particle Microscope and Method for Operating the Same
Carl Zeiss Multisem GmbH
0 cites - 0 cites
- US122834572025Multiple Particle Beam Microscope and Associated Method with an Improved Focus Setting Taking Into Account an Image Plane Tilt
Carl Zeiss Multisem GmbH
0 cites - 0 cites
- US122494782025Particle Beam System for Azimuthal Deflection of Individual Particle Beams and Method for Azimuth Correction in a Particle Beam System
Carl Zeiss Multisem GmbH
0 cites - US121192042024Particle Beam System and the Use Thereof for Flexibly Setting the Current Intensity of Individual Particle Beams
Carl Zeiss Multisem GmbH
0 cites - 0 cites
- US119357212024System Comprising a Multi-beam Particle Microscope and Method for Operating the Same
Carl Zeiss Multisem GmbH
0 cites - 0 cites
- 0 cites
- US116579992023Particle Beam System and Method for the Particle-optical Examination of an Object
Carl Zeiss Multisem GmbH
0 cites - US116457402023Method for Detector Equalization During the Imaging of Objects with a Multi-beam Particle Microscope
Carl Zeiss Multisem GmbH
0 cites - US115628802023Particle Beam System for Adjusting the Current of Individual Particle Beams
Carl Zeiss Multisem GmbH
0 cites - 0 cites