9 Patents
- US121967812025Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes
Microfabrica Inc.
0 cites - US121967822025Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes
Microfabrica Inc.
0 cites - US120664622024Probes with Planar Unbiased Spring Elements for Electronic Component Contact and Methods for Making Such Probes
Microfabrica Inc.
0 cites - 0 cites
- US118677212024Probes with Multiple Springs, Methods for Making, and Methods for Using
Microfabrica Inc.
0 cites - US118219182023Buckling Beam Probe Arrays and Methods for Making Such Arrays Including Forming Probes with Lateral Positions Matching Guide Plate Hole Positions
MICROFABRICA Inc.
0 cites - US116301272023Multi-layer, Multi-material Micro-scale and Millimeter-scale Devices with Enhanced Electrical And/or Mechanical Properties
University Of Southern California
0 cites