Patents/Inventors

Deepak Chand Jangid

Cedar Park, TXUS2 patents

2 Patents

US125499152026
In-sync Digital Waveform Comparison to Determine Pass/fail Results of a Device Under Test (DUT)
ROKU, Inc.
0 cites
US118439212023
In-sync Digital Waveform Comparison to Determine Pass/fail Results of a Device Under Test (DUT)
ROKU, Inc.
0 cites