4 Patents
- US123802662025Layout Design Method and Method of Manufacturing Integrated Circuit Device Using the Same
SAMSUNG ELECTRONICS CO., Ltd.
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- US119778282024Method for Detecting Stochastic Weak Points of Layout Pattern of Semiconductor Integrated Circuit and Computer System Performing the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US117400732023Method for Measuring CD Using Scanning Electron Microscope
SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION
0 cites