Dawei Hu

6 Patents

• US125327102026

  Measurements of Semiconductor Structures Based on Spectral Differences at Different Process Steps

  KLA Coporation

  0 cites
• US125026542025

  Hydrogenation Catalyst and Preparation Method Therefor and Use Thereof

  RESEARCH INSTITUTE OF PETROLEUM PROCESSING, SINOPEC

  0 cites
• US124670042025

  Process and System for Hydrotreating Deoiled Asphalt

  RESEARCH INSTITUTE OF PETROLEUM PROCESSING, SINOPEC

  0 cites
• US123312562025

  Process and System for Processing Aromatics-rich Fraction Oil

  RESEARCH INSTITUTE OF PETROLEUM PROCESSING, SINOPEC

  0 cites
• US117963902023

  Bandgap Measurements of Patterned Film Stacks Using Spectroscopic Metrology

  KLA Corporation

  0 cites
• US115730772023

  Scatterometry Based Methods and Systems for Measurement of Strain in Semiconductor Structures

  KLA Corporation

  0 cites