Patents/Inventors

Davit Harutyunyan

San Jose, CAUS1 patent

2 Patents

US118031272023
Method for Determining Root Cause Affecting Yield in a Semiconductor Manufacturing Process
ASML NETHERLANDS B.V.
0 cites
US117549312023
Method for Determining Corrections for Lithographic Apparatus
ASML NETHERLANDS B.V.
0 cites