Patents/Inventors

David W. Price

Austin, TXUS8 patents

8 Patents

US124223762025
Imaging Reflectometry for Inline Screening
KLA Corporation
0 cites
US123321822025
System for Automatic Diagnostics and Monitoring of Semiconductor Defect Die Screening Performance Through Overlay of Defect and Electrical Test Data
KLA Corporation
0 cites
US118990652024
System and Method to Weight Defects with Co-located Modeled Faults
KLA Corporation
0 cites
US117988272023
Systems and Methods for Semiconductor Adaptive Testing Using Inline Defect Part Average Testing
KLA Corporation
0 cites
US117546252023
System and Method for Identifying Latent Reliability Defects in Semiconductor Devices
KLA Corporation
0 cites
US116562742023
Systems and Methods for Evaluating the Reliability of Semiconductor Die Packages
KLA Corporation
0 cites
US116247752023
Systems and Methods for Semiconductor Defect-guided Burn-in and System Level Tests
KLA Corporation
0 cites
US116144802023
System and Method for Z-PAT Defect-guided Statistical Outlier Detection of Semiconductor Reliability Failures
KLA Corporation
0 cites