David M. Fried

5 Patents

• US124752972025

  System and Method for Performing Process Model Calibration in a Virtual Semiconductor Device Fabrication Environment

  Coventor, Inc.

  0 cites
• US124234862025

  System and Method for Process Window Optimization in a Virtual Semiconductor Device Fabrication Environment

  Coventor, Inc.

  0 cites
• US118612892024

  System and Method for Performing Process Model Calibration in a Virtual Semiconductor Device Fabrication Environment

  Coventor, Inc.

  0 cites
• US116309372023

  System and Method for Predictive 3-D Virtual Fabrication

  Coventor, Inc.

  0 cites
• US116249812023

  Resist and Etch Modeling

  Lam Research Corporation

  0 cites