Patents/Inventors

David Irwin Margolese

Pomona, CAUS10 patents

11 Patents

US121256862024
Electron Bias Control Signals for Electron Enhanced Material Processing
VELVETCH, LLC
0 cites
US121192052024
Atomic Layer Etching by Electron Wavefront
VELVETCH LLC
0 cites
US120273482024
Electron Bias Control Signals for Electron Enhanced Material Processing
VELVETCH LLC
0 cites
US119423062024
Atomic Layer Etching by Electron Wavefront
VELVETCH LLC
0 cites
US118878232024
Electron Bias Control Signals for Electron Enhanced Material Processing
VELVETCH LLC
0 cites
US118697472024
Atomic Layer Etching by Electron Wavefront
VELVETCH LLC
0 cites
US118107572023
Atomic Layer Etching by Electron Wavefront
VELVETCH LLC
0 cites
US117156232023
DC Plasma Control for Electron Enhanced Material Processing
VELVETCH LLC
0 cites
US116885882023
Electron Bias Control Signals for Electron Enhanced Material Processing
VELVETCH LLC
0 cites
US116767972023
DC Plasma Control for Electron Enhanced Material Processing
VELVETCH LLC
0 cites
US116641952023
DC Plasma Control for Electron Enhanced Material Processing
VELVETCH LLC
0 cites