David I-chun Lee

3 Patents

• US119748452024

  System and Method for Factory Calibration or Reduced Calibration of an Indwelling Sensor Based on Sensitivity Profile and Baseline Model of Sensors

  Dexcom, Inc.

  0 cites
• US117140602023

  Automatic Analyte Sensor Calibration and Error Detection

  Dexcom, Inc.

  0 cites
• US116561952023

  Automatic Analyte Sensor Calibration and Error Detection

  Dexcom, Inc.

  0 cites