11 Patents
- US123600632025System and Method for Measuring a Sample by X-ray Reflectance Scatterometry
NOVA MEASURING INSTRUMENTS Inc.
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- US121658632024Systems and Approaches for Semiconductor Metrology and Surface Analysis Using Secondary Ion Mass Spectrometry
NOVA MEASURING INSTRUMENTS Inc.
0 cites - US120231742024Detecting Cyanide Exposure Based on Thiocyanate Measurement in Saliva
The Government Of The United States Of America, As Represented By The Secretary Of Homeland Security
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- US117640502023Systems and Approaches for Semiconductor Metrology and Surface Analysis Using Secondary Ion Mass Spectrometry
NOVA MEASURING INSTRUMENTS Inc.
0 cites - US115898082023Detecting Cyanide Exposure Based on Thiocyanate Measurement
The Government Of The United States Of America, As Represented By The Secretary Of Homeland Security
0 cites - 0 cites