Daniel Rhinow

5 Patents

• US125867552026

  Apparatus for Analyzing And/or Processing a Sample with a Particle Beam and Method

  Carl Zeiss SMT GmbH

  0 cites
• US125357262026

  Method and Apparatus for Setting a Side Wall Angle of a Pattern Element of a Photolithographic Mask

  Carl Zeiss SMT GmbH

  0 cites
• US125357292026

  Method and Apparatus for Mask Repair

  Carl Zeiss SMT GmbH

  0 cites
• US119617052024

  Method and Apparatus for Examining a Beam of Charged Particles

  Carl Zeiss SMT GmbH

  0 cites
• US115781732023

  Method for Preparing a Cross-linked Hydrogel Nanomembrane, the Cross-linked Hydrogel Nanomembrane, TEM Grid Comprising the Same and Use Thereof

  Max-planck-gesellschaft Zur Förderung Der

  0 cites