Patents/Inventors

Daniel Kandel

RehovotIL4 patents

4 Patents

US122363642025
Metrology and Process Control for Semiconductor Manufacturing
NOVA Ltd
0 cites
US121173472024
Metrology Target Design for Tilted Device Designs
KLA Corporation
0 cites
US117631812023
Metrology and Process Control for Semiconductor Manufacturing
NOVA Ltd
0 cites
US117106162023
Tem-based Metrology Method and System
0 cites