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Daniel C. Edelstein
White Plains, NY
US
2 patents
3 Patents
USRE050494
2025
Self-forming Embedded Diffusion Barriers
TESSERA LLC
0 cites
US11881433
2024
Advanced Copper Interconnects with Hybrid Microstructure
Tessera LLC
0 cites
US11804405
2023
Method of Forming Copper Interconnect Structure with Manganese Barrier Layer
Tessera LLC
0 cites