Patents/Inventors

Daisuke Yokoi

TokyoJP1 patent

2 Patents

US115869812023
Failure Analysis Device, Failure Analysis Method, and Failure Analysis Program
NEC CORPORATION
0 cites
US115683132023
Control Apparatus, Analysis Apparatus, Communication System, Data Processing Method, Data Transmission Method, and Non-transitory Computer Readable Medium
NEC CORPORATION
0 cites