27 Patents
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- US124630692025Wafer Temperature Control Device, Wafer Temperature Control Method, and Wafer Temperature Control Program
HORIBA STEC, Co., Ltd.
0 cites - US124485552025Composition for Forming Thermally Conductive Material, Thermally Conductive Material, and Surface-modified Inorganic Substance
FUJIFILM Corporation
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- US124214262025Composition, Thermally Conductive Sheet, and Device with Thermally Conductive Layer
FUJIFILM Corporation
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- US123918592025Composition for Forming Thermally Conductive Material, and Thermally Conductive Material
FUJIFILM Corporation
0 cites - US123767742025Information Processing System, Information Processing Method, and Information Processing Apparatus Based on Audience Emotion for Audience Placement
FUJIFILM Corporation
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- US121757002024Information Processing Apparatus, Information Processing Method, Guide System, and Guide Method
FUJIFILM Corporation
0 cites - US121548032024Substrate-floatation-type Laser Processing Apparatus and Method for Measuring Floating Height
JSW AKTINA SYSTEM CO., Ltd
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- US120307742024Surface-modified Inorganic Nitride, Composition, Thermally Conductive Material, and Device with Thermally Conductive Layer
FUJIFILM Corporation
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- US119357312024Plasma Processing Apparatus, Plasma State Detection Method, and Plasma State Detection Program
TOKYO ELECTRON LIMITED
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- US117462952023Polymerizable Liquid Crystal Composition, Optically Anisotropic Film, Optical Film, Polarizing Plate, and Image Display Device
FUJIFILM Corporation
0 cites - US117495452023Substrate-floatation-type Laser Processing Apparatus and Method for Measuring Floating Height
JSW AKTINA SYSTEM CO., Ltd
0 cites - 0 cites
- US117025962023Polymerizable Liquid Crystal Composition, Optically Anisotropic Film, Optical Film, Polarizing Plate, and Image Display Device
FUJIFILM Corporation
0 cites - 0 cites