Patents/Inventors

Daisuke Bizen

TokyoJP7 patents

7 Patents

US126092692026
Inspection System
Hitachi High-tech Corporation
0 cites
US125059762025
Charged Particle Beam Apparatus and Method for Calculating Roughness Index
HITACHI HIGH-TECH CORPORATION
0 cites
US124068262025
Charged Particle Beam Device and Sample Observation Method
HITACHI HIGH-TECH CORPORATION
0 cites
US121911112025
Charged Particle Beam System and Method for Determining Observation Conditions in Charged Particle Beam Device
Hitachi High-tech Corporation
0 cites
US121815132024
Inspection Method
Hitachi High-tech Corporation
0 cites
US118697452024
Charged Particle Beam Device
HITACHI HIGH-TECH CORPORATION
0 cites
US116107562023
Charged Particle Beam Apparatus and Control Method
HITACHI HIGH-TECH CORPORATION
0 cites