Daiki Ata

5 Patents

• US123974172025

  Learning Device, Diagnostic System, and Model Generation Method to Diagnose Abnormality Based on Temperature Measurement in a Production Facility

  MITSUBISHI ELECTRIC CORPORATION

  0 cites
• US122661992025

  Inference Device, Inference Method, and Recording Medium

  MITSUBISHI ELECTRIC CORPORATION

  0 cites
• US121188092024

  Image-filter Generation System, Image-filter Generation Device, Learning Device, and Learning Method

  MITSUBISHI ELECTRIC CORPORATION

  0 cites
• US116355172023

  Parameter Adjustment Device, Training Device, and Measurement System

  MITSUBISHI ELECTRIC CORPORATION

  0 cites
• US115925552023

  Setting Value Adjustment Device for Displacement Meter

  MITSUBISHI ELECTRIC CORPORATION

  0 cites