5 Patents
- US124370612025Log Generation Apparatus, Abnormality Detection System, Log Generation Method, and Non-transitory Computer Readable Medium
NEC CORPORATION
0 cites - US122423292025Turn on Functional Module and Related Functional Module Based on Generated Disk Image
NEC CORPORATION
0 cites - US117292082023Impact Range Estimation Apparatus, Impact Range Estimation Method, and Computer-readable Recording Medium
NEC CORPORATION
0 cites - 0 cites