Patents/Inventors

Cornel Bozdog

San Jose, CAUS3 patents

4 Patents

US120663912024
Method and System for Non-destructive Metrology of Thin Layers
NOVA MEASURING INSTRUMENTS, Inc.
0 cites
US119064512024
Method and System for Non-destructive Metrology of Thin Layers
GLOBALFOUNDRIES U.S. Inc.
0 cites
US118857372024
Method and System for Optical Characterization of Patterned Samples
Nova Ltd.
0 cites
US116686632023
Method and System for Non-destructive Metrology of Thin Layers
NOVA MEASURING INSTRUMENTS, Inc.
0 cites