27 Patents
- 0 cites
- US122898992025Nitride-based Semiconductor Device and Method for Manufacturing the Same
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., Ltd.
0 cites - US122645822025In-situ Stress Measurement Device and Method for Ultra-deep Non-vertical Drilling
Changjing River Scientific Research Institute
0 cites - US122551692025Nitride-based Semiconductor Module and Method for Manufacturing the Same
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., Ltd.
0 cites - US122181282025Nitride-based Semiconductor Bidirectional Switching Device and Method for Manufacturing the Same
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., Ltd.
0 cites - US121990002025Semiconductor Device Structures and Methods of Manufacturing the Same
INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., Ltd.
0 cites - US121763432024Nitride-based Semiconductor Bidirectional Switching Device and Method for Manufacturing the Same
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., Ltd.
0 cites - US121661142024Semiconductor Device Structures and Methods of Manufacturing the Same
INNOSCIENCE (SUZHOU) SEMICONDUCTOR CO., Ltd.
0 cites - US121258442024Nitride-based Semiconductor Bidirectional Switching Device and Method for Manufacturing the Same
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., Ltd.
0 cites - 0 cites
- US120877632024Nitride-based Semiconductor Bidirectional Switching Device and Method for Manufacturing the Same
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., Ltd.
0 cites - US120741592024Nitride-based Semiconductor Bidirectional Switching Device and Method for Manufacturing the Same
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., Ltd.
0 cites - US120626532024Nitride-based Semiconductor Bidirectional Switching Device and Method for Manufacturing the Same
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., Ltd.
0 cites - US120384692024System and Method for Measuring Intermittent Operating Life of Gan-based Device
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., Ltd.
0 cites - US120402442024Nitride Semiconductor Device and Method for Manufacturing the Same
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., Ltd.
0 cites - US120403942024Semiconductor Device Having Improved Gate Leakage Current
INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., Ltd.
0 cites - 0 cites
- US119729962024Semiconductor Device Structures and Methods of Manufacturing the Same
INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., Ltd.
0 cites - US119675192024Integrated Semiconductor Device and Method for Manufacturing the Same
INNOSCIENCE (SUZHOU) SEMICONDUCTOR CO., Ltd.
0 cites - US119675212024Integrated Semiconductor Device and Method for Manufacturing the Same
INNOSCIENCE (SUZHOU) SEMICONDUCTOR CO., Ltd.
0 cites - US118627222024Semiconductor Device Structures and Methods of Manufacturing the Same
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., Ltd.
0 cites - US118307862023Semiconductor Package and Method for Manufacturing the Same
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., Ltd.
0 cites - US117842372023Semiconductor Devices and Methods of Manufacturing the Same
INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., Ltd.
0 cites - US117698262023Semiconductor Device with Asymmetric Gate Structure
INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., Ltd.
0 cites - US117473892023Device and Method for Measuring High Electron Mobility Transistor
INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., Ltd.
0 cites - US117473902023Apparatus and Method for Measuring Dynamic On-resistance of Gan-based Device
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., Ltd.
0 cites - US116998992023Electronic Device and Electrostatic Discharge Protection Circuit
INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., Ltd.
0 cites