Chung-lun Kuo

6 Patents

• US126017772026

  Inspection System and Method for Inspecting Light-emitting Diodes

  Industrial Technology Research Institute

  0 cites
• US122706382025

  Measurement System and Measurement Method

  Industrial Technology Research Institute

  0 cites
• US122039712025

  Apparatus and Method for Inspecting Light-emitting Diode Dies

  Industrial Technology Research Institute

  0 cites
• US120990532024

  Method of Training AI for Label-free Cell Viability Determination and Label-free Cell Viability Determination Method by Trained AI

  INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

  0 cites
• US120072212024

  Heterogeneous Integration Detecting Method and Heterogeneous Integration Detecting Apparatus

  Industrial Technology Research Institute

  0 cites
• US116561812023

  Inspection Apparatus and Inspection Method for Inspecting Light-emitting Diodes

  Industrial Technology Research Institute

  0 cites