Patents/Inventors

Chung-cheng Chen

Miaoli CountyTW2 patents

3 Patents

US124068902025
Method for Measuring Overlay Shift of Bonded Wafers
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites
US122179602025
Semiconductor Devices and Methods of Manufacture
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites
US120573532024
Measurement Pattern and Method for Measuring Overlay Shift of Bonded Wafers
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites