4 Patents
- US124245732025Passivation Scheme for Pad Openings and Trenches
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US121639952024Gan Reliability Built-in Self Test (BIST) Apparatus and Method for Qualifying Dynamic On-state Resistance Degradation
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - US120027742024Passivation Scheme for Pad Openings and Trenches
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US116809782023Gan Reliability Built-in Self Test (BIST) Apparatus and Method for Qualifying Dynamic On-state Resistance Degradation
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites