Chun-ting Liu

5 Patents

• US124930042025

  Method for Determining Parameters of Three Dimensional Nanostructure and Apparatus Applying the Same

  INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

  0 cites
• US122847932025

  Cooling Systems, Cooling Structures and Electronic Devices and Methods for Manufacturing or Operating Cooling Systems, Cooling Structures and Electronic Devices

  Intel Corporation

  0 cites
• US121888832025

  X-ray Reflectometry Apparatus and Method Thereof for Measuring Three Dimensional Nanostructures on Flat Substrate

  INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

  0 cites
• US118675952024

  X-ray Reflectometry Apparatus and Method Thereof for Measuring Three Dimensional Nanostructures on Flat Substrate

  INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

  0 cites
• US115790992023

  X-ray Reflectometry Apparatus and Method Thereof for Measuring Three Dimensional Nanostructures on Flat Substrate

  INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

  0 cites