7 Patents
- US124143292025Forming Low-resistance Capping Layer Over Metal Gate Electrode
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US123621892025Semiconductor Devices and Methods of Manufacturing Thereof
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - US123639662025Semiconductor Devices and Method of Forming the Same
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US120949482024Forming Low-resistance Capping Layer Over Metal Gate Electrode
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US120740352024Method for Partially Removing Tungsten in Semiconductor Manufacturing Process
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US118548162023Semiconductor Devices and Methods of Manufacturing Thereof
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US115880202023Semiconductor Device and Method for Manufacturing the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites