Patents/Inventors

Chuan-hsiang Sun

TaoyuanTW2 patents

3 Patents

US123457602025
Apparatus for Probing Device-under-test
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites
US120190972024
Method for Forming Probe Head Structure
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites
US118219422023
Apparatus and Method for Probing Device-under-test
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites