Chrysostomos Batistakis

6 Patents

• US125861702026

  System and Method for Generating Predictive Images for Wafer Inspection Using Machine Learning

  ASML Netherlands B.V.

  0 cites
• US125671642026

  Apparatus and Method for Determining Three Dimensional Data Based on an Image of a Patterned Substrate

  ASML NETHERLANDS B.V.

  0 cites
• US119149422024

  Method for Predicting Resist Deformation

  ASML NETHERLANDS B.V.

  0 cites
• US118806402024

  Systems and Methods for Predicting Layer Deformation

  ASML NETHERLANDS B.V.

  0 cites
• US117099882023

  Method for Predicting Resist Deformation

  ASML NETHERLANDS B.V.

  0 cites
• US116255202023

  Systems and Methods for Predicting Layer Deformation

  ASML NETHERLANDS B.V.

  0 cites