14 Patents
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- US125301272026Temperature Profile Tracking for Adaptive Data Integrity Scan Rate in a Memory Device
Micron Technology, Inc.
0 cites - US124511972025Adaptive Integrity Scan Rates in a Memory Sub-system Based on Block Health Metrics
Micron Technology, Inc.
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- US117155312023Open Block Management Using Storage Charge Loss Margin Checking
Micron Technology, Inc.
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- US116874522023Dynamic Program-verify Voltage Adjustment for Intra-block Storage Charge Loss Uniformity
Micron Technology, Inc.
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