Patents/Inventors

Christopher Liman

San Jose, CAUS2 patents

3 Patents

US124808932025
Optical and X-ray Metrology Methods for Patterned Semiconductor Structures with Randomness
KLA Corporation
0 cites
US120190302024
Methods and Systems for Targeted Monitoring of Semiconductor Measurement Quality
KLA Corporation
0 cites
US119903802024
Methods and Systems for Combining X-ray Metrology Data Sets to Improve Parameter Estimation
KLA Corporation
0 cites