8 Patents
- 0 cites
- US123458642025Apparatus and Method for Manipulating a Focus of Excitation Light on or in a Sample and Microscope
Carl Zeiss Microscopy GmbH
0 cites - US123356142025Method and Device for Determining the Optimal Position of the Focal Plane for Examining a Specimen by Microscopy
Carl Zeiss Microscopy GmbH
0 cites - US123073342025Method and Device for Evaluating a Statistically Distributed Measured Value in the Examination of an Element of a Photolithography Process
Carl Zeiss SMT GmbH
0 cites - US121115792024Method and Apparatus for Evaluating an Unknown Effect of Defects of an Element of a Photolithography Process
Carl Zeiss SMT GmbH
0 cites - US120011452024Apparatus and Method for Analyzing an Element of a Photolithography Process with the Aid of a Transformation Model
Carl Zeiss SMT GmbH
0 cites - US118927692024Method for Detecting an Object Structure and Apparatus for Carrying Out the Method
Carl Zeiss SMT GmbH
0 cites - US117748592023Method and Apparatus for Evaluating an Unknown Effect of Defects of an Element of a Photolithography Process
Carl Zeiss SMT GmbH
0 cites