Christof Riedesel

8 Patents

• US126092822026

  Multi-beam Charged Particle System and Method of Controlling the Working Distance in a Multi-beam Charged Particle System

  Carl Zeiss Multisem GmbH

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• US125867492026

  Certain Improvements of Multi-beam Generating and Multi-beam Deflecting Units

  Carl Zeiss Multisem GmbH

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• US124313242025

  Multi-beam Digital Scan and Image Acquisition

  Carl Zeiss Multisem GmbH

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• US122834572025

  Multiple Particle Beam Microscope and Associated Method with an Improved Focus Setting Taking Into Account an Image Plane Tilt

  Carl Zeiss Multisem GmbH

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• US122550402025

  Multi-beam Particle Beam System and Method for Operating Same

  Carl Zeiss Multisem GmbH

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• US117281302023

  Method of Recording an Image Using a Particle Microscope

  Carl Zeiss SMT GmbH

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• US116457402023

  Method for Detector Equalization During the Imaging of Objects with a Multi-beam Particle Microscope

  Carl Zeiss Multisem GmbH

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• US115628812023

  Charged Particle Beam System

  Carl Zeiss Multisem GmbH

  0 cites